Unthinkable functionality 40 years ago. I built a test system for Fairchild, at the time (pre-1984) MFG Test still had to set up manual bench equipment to replicate sequential device test conditions that could not be performed by existing ATE. I used an HP controller, IEEE488 bussed programmable oscilloscope, a few programmable power supplies, programmable waveform generator, homemade counter. Wrote the tester OS in HP Basic, ran that through an Infoteck Compiler (converting interpretive HP Basic to much faster executing machine code) and did it all on a 1M extended memory board. We ended up making 6 of these systems that performed sequential tests like tset, thold, fmax, minPW, edge rates, differential outputs, etc. on all of our 24 pin or less sequential digital mil/aero devices . 3 of these rack-and-stack systems were shipped to our satellite mfg site in Singapore. I had average full test time down to just under 1sec for most all devices that used to take hours between bench setups and LTPD sample testing. It eliminated so much potential human error, increased throughput so we could test complete lots instead of samples. That was one of the most enjoyable and satisfying projects of my career. I did a lot of automation work in the 1980s. There seemed to be low hanging fruit wherever I looked. I really enjoyed those years.